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	Surface Science UHV systems

	UHV Scanning Probe Microscopy

	Auger & ESCA solutions

	ESCA+

	In-Situ SPM/SEM/SAM/FIB solutions

	Electron Spectrometers

	LEED Instruments

	PEEM

	Excitation sources

	MBE & Deposition




Custom Systems and Components

	Ionizers and Ion Optics
	Ion Guides and Collision Cells
	Mass Filters and MS/MS Devices
	MS/MS Systems
	Vacuum Chambers
	Gas Handling and Valving
	Systems

Electronics

	Controller and Software
	RF/DC and RF - Only Power Supplies

Gas Analysis Systems

	VeraSpec Trace Gas Purity System
	Lamp Analyzer
	MAX300-LG Laboratory Gas Analyzer

Ionizers and Ion Opticss

	Electron Ionization (EI)
	Chemical Ionization (CI)
	Atmospheric Pressure Ionization (API)
	Ion-Molecule Reaction Ionization
	Ion Optics (API)

	Molecular Beam and Plasma Analysis Systems (API)

	Ion Guides and Collision Cells
	Quadrupole Mass Filters

	Quadrupole Mass Spectrometers and Residual Gas Analyzers

	Thermal Desorption Systems




	Channel Electron Multipliers




	RHEED Systems




	MBE Systems and Components
	Substrate Manipulation
	Effusion cells
	Valved sources
	E-beam Evaporators
	Dopant Cells
	Gas sources
	In-situ etching systems




	R&D type PVD/CVD
	Sputter system
	Evaporator system
	Microwave Plasma Enhanced CVD
	Cryogenic Probing system
	Plasma Surface Treatment
	UHV/HV Components



	Surface Analysis Instrumentation
	Direct Replacement (for PHI systems)
	Water-Vapor Desorption
	Current Measurement
	9103 USB Picoammeter
	Sputter Ion Sources



	Edge Welded Bellows
	Linear Shift Mechanisms
	Motor Controllers
	Port Aligners
	Radial Distribution Chamber
	Rotary Drives
	Sample Heater / Deposition Stages
	Sample Transfer Tools
	Shutters
	Synchrotron Beam Finder/Aligner
	Wobble Stick
	Y / XY / XYZ Manipulators
	XYZ Helium Cryostats
	Goniometers